In situ XPS characterization of diamond films after AR.sup.+./sup. cluster ion beam sputtering

ARTEMENKO, A., BABCHENKO, O., KOZAK, H., UKRAINTSEV, E., IŽÁK, T., ROMANYUK, O., POTOCKÝ, Š., KROMKA, A. In situ XPS characterization of diamond films after AR⁺ cluster ion beam sputtering. In: NANOCON 2015: 7th International Conference on Nanomaterials - Research and Application, Conference Proceedings. Ostrava: TANGER, spol. s r.o., 2015, s. 605-610. ISBN 978-80-87294-63-5.