Srnanek, R. - Vincze, A. - Kovac, J. - Gregora, Ivan - Mc Phail, D. S. - Gottschalsch, V.
A Raman study of GaAsN, GaInAsN layers on bevelled samples.
Materials Science and Engineering B-Advanced Functional Solid-State Materials. 91-92, - (2002), s. 87-90. ISSN 0921-5107. E-ISSN 1873-4944.
[International Conference of Defects /9./. Rimini, 24.09.2001-28.09.2001]
Grant - others:GA-(SK) 1/7600/20; GA-(SK) 4/7643/20
http://hdl.handle.net/11104/0031718