Počet záznamů: 1
Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument
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SYSNO ASEP 0582700 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument Tvůrce(i) Makarov, S. (RU)
Makita, M. (DE)
Nakatsutsumi, M. (DE)
Pikuz, T.A. (JP)
Ozaki, N. (JP)
Preston, T.R. (DE)
Appel, K. (DE)
Konopková, Z. (DE)
Cerantola, V. (IT)
Brambrink, E. (DE)
Schwinkendorf, J.P. (DE)
Mohacsi, I. (DE)
Burian, Tomáš (UFP-V) ORCID
Chalupský, J. (CZ)
Hájková, V. (CZ)
Juha, L. (CZ)
Vozda, V. (CZ)
Nagler, B. (US)
Zastrau, U. (DE)
Pikuz, S. (RU)
Yabashi, M. (JP)Celkový počet autorů 21 Zdroj.dok. Journal of Synchrotron Radiation. - : Oxford Blackwell - ISSN 0909-0495
Roč. 30, January (2023), s. 208-216Poč.str. 9 s. Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova compound refractive lenses ; focusing system ; lithium fluoride (LiF) detector ; X-ray beam characterization ; X-ray focusing ; X-ray free-electron lasers Vědní obor RIV BH - Optika, masery a lasery Obor OECD Optics (including laser optics and quantum optics) CEP GA20-08452S GA ČR - Grantová agentura ČR Způsob publikování Open access Institucionální podpora UFP-V - RVO:61389021 UT WOS 000908417600019 EID SCOPUS 85145536582 DOI 10.1107/S1600577522006245 Anotace The application of fluorescent crystal media in wide-range X-ray detectors provides an opportunity to directly image the spatial distribution of ultra-intense X-ray beams including investigation of the focal spot of free-electron lasers. Here the capabilities of the micro- and nano-focusing X-ray refractive optics available at the High Energy Density instrument of the European XFEL are reported, as measured in situ by means of a LiF fluorescent detector placed into and around the beam caustic. The intensity distribution of the beam focused down to several hundred nanometers was imaged at 9 keV photon energy. A deviation from the parabolic surface in a stack of nanofocusing Be compound refractive lenses (CRLs) was found to affect the resulting intensity distribution within the beam. Comparison of experimental patterns in the far field with patterns calculated for different CRL lens imperfections allowed the overall inhomogeneity in the CRL stack to be estimated. The precise determination of the focal spot size and shape on a sub-micrometer level is essential for a number of high energy density studies requiring either a pin-size backlighting spot or extreme intensities for X-ray heating. Pracoviště Ústav fyziky plazmatu Kontakt Vladimíra Kebza, kebza@ipp.cas.cz, Tel.: 266 052 975 Rok sběru 2024 Elektronická adresa https://scripts.iucr.org/cgi-bin/paper?S1600577522006245
Počet záznamů: 1