Počet záznamů: 1
Energy Sensitive Imaging of Focused and Scanning Ion Microbeams with µm Spatial and µs Time Resolution
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SYSNO ASEP 0565860 Druh ASEP C - Konferenční příspěvek (mezinárodní konf.) Zařazení RIV D - Článek ve sborníku Název Energy Sensitive Imaging of Focused and Scanning Ion Microbeams with µm Spatial and µs Time Resolution Tvůrce(i) Granja, C. (CZ)
Oancea, C. (CZ)
Macková, Anna (UJF-V) RID, ORCID, SAI
Havránek, Vladimír (UJF-V) RID, SAI, ORCID
Olšanský, Václav (UJF-V) ORCIDCelkový počet autorů 5 Číslo článku 01007 Zdroj.dok. EPJ Web of Conferences, 261. - Les ulis : EDP sciences, 2022 Poč.str. 12 s. Forma vydání Online - E Akce Applied Nuclear Physics Conference (ANPC 2021) Datum konání 12.09.2021 - 17.09.2021 Místo konání Prague Země CZ - Česká republika Typ akce WRD Jazyk dok. eng - angličtina Země vyd. FR - Francie Klíč. slova ion microbeam ; detectors Obor OECD Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect) Výzkumná infrastruktura CANAM II - 90056 - Ústav jaderné fyziky AV ČR, v. v. i. Institucionální podpora UJF-V - RVO:61389005 DOI 10.1051/epjconf/202226101007 Anotace We inspected and imaged the delivery of ion microbeams with spatial, time and energy sensitivity. Quantum imaging registration event- by-event is provided in high spatial and time resolution with the positionsensitive semiconductor pixel detector Timepix. The detector is operated as a miniaturized radiation camera for flexible measurements at room temperature and in vacuum. Imaging information on beam profile, spatial and time distribution, flux, homogeneity, and deposited energy for individual beam particles is provided. Focused and scanning beams can be imaged and evaluated online. Single particles are registered by the detector including spectral (deposited energy) information on their position at the µm and µs level. Delivered beams can be characterized also in terms of composition by resolving background and unwanted components such as electrons and X rays from primary beam particles. Ion groups of different energy including doublets or scattered particles can be identified. The technique is applicable for ions of energy above few hundred keV and beams of low intensity, below 105 particles/cm2/s. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2023 Elektronická adresa https://doi.org/10.1051/epjconf/202226101007
Počet záznamů: 1