A novel in-lens detector for electrostatic scanning LEEM mini-column

0205230 - UPT-D 20000006 RIV NL eng J - Článek v odborném periodiku
Frank, Luděk - Müllerová, Ilona - El Gomati, M. M.
A novel in-lens detector for electrostatic scanning LEEM mini-column.
Ultramicroscopy. Roč. 81, č. 2 (2000), s. 99-110. ISSN 0304-3991. E-ISSN 1879-2723
Výzkumný záměr: CEZ:AV0Z2065902
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 1.695, rok: 2000

A novel principle of an in-lens detector of very slow detectors is described and the detector efficiency discussed. The detector was built into a coaxial column for a Cylindrical Mirror Analyser for Auger electron microanalysis. In order to obtain a very low energy scanned imaging, a cathode lens was formed between the final electrode of the column and a negatively biased specimen. The signal electrons accelerated within the cathode lens field enter the column and after being mirrored back impact a micro-channel-plate based detector fitted around the optical axis. The acceptance of the detector, expressed as a ratio of the number of electrons impacting the detector to the full emission of a cosine source, was calculated to be 0.86 for 1 eV and 0.985 for 10 eV electrons. Then, efficiency of conversion into output pulses is 0.35 and 0.31, respectively, these parameters are superior to those of conventional SEM detectors for secondary electrons. Micrographs taken at low energies ranging down to units of eV are presented.
Trvalý link: http://hdl.handle.net/11104/0100848