Počet záznamů: 1
Changes of morphological, optical and electrical properties induced by hydrogen plasma on (0001) ZnO surface
- 1.0548925 - FZÚ 2023 RIV DE eng J - Článek v odborném periodiku
Remeš, Zdeněk - Artemenko, Anna - Ukraintsev, Egor - Sharma, Dhananjay K. - Buryi, Maksym - Kromka, Alexander - Potocký, Štěpán - Szabó, Ondrej - Kuliček, J. - Rezek, B. - Poruba, A. - Míčová, J. - Shu Hsu, H.
Changes of morphological, optical and electrical properties induced by hydrogen plasma on (0001) ZnO surface.
Physica Status Solidi A. Roč. 219, č. 16 (2022), č. článku 2100427. ISSN 1862-6300. E-ISSN 1862-6319
Grant CEP: GA MŠMT(CZ) EF16_019/0000760; GA ČR GC19-02858J
Grant ostatní: OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760; AV ČR(CZ) SAV-21-09; AV ČR(CZ) StrategieAV21/6
Program: Bilaterální spolupráce; StrategieAV
Výzkumná infrastruktura: CzechNanoLab - 90110
Institucionální podpora: RVO:68378271
Klíčová slova: ZnO * plasma * XPS * AFM * PL
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 2, rok: 2022
Způsob publikování: Open access s časovým embargem
https://doi.org/10.1002/pssa.202100427
Plasma provides specific adjustment of solid-state surface properties offering an alternative to high temperature treatment. In this work, hydrogen plasma treatment of monocrystalline (0001) ZnO surface is studied in an inductively coupled plasma (ICP) reactor with reduced capacitively coupled plasma mode. We explain the crucial role of electrical grounding of the sample holder for plasma etching and related changes in the morphology, optical and electrical properties of surfaces exposed to electron and ion bombardment. The effects on the chemical composition of the surface are analyzed by (XPS), optical properties by photoluminescence spectroscopy, topography, roughness and surface potential by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM). All methods show altered ZnO surface properties before and after plasma treatment strongly depending on the electrical potential of the holder.
Trvalý link: https://hdl.handle.net/11104/0334158
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