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Powder nano-beam diffraction in scanning electron microscope: fast and simple method for analysis of nanoparticle crystal structure
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SYSNO ASEP 0541840 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Powder nano-beam diffraction in scanning electron microscope: fast and simple method for analysis of nanoparticle crystal structure Tvůrce(i) Šlouf, Miroslav (UMCH-V) RID, ORCID
Skoupý, Radim (UPT-D) RID, ORCID, SAI
Pavlova, Ewa (UMCH-V) RID
Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAIČíslo článku 962 Zdroj.dok. Nanomaterials. - : MDPI
Roč. 11, č. 4 (2021)Poč.str. 17 s. Jazyk dok. eng - angličtina Země vyd. CH - Švýcarsko Klíč. slova nanoparticle analysis ; powder nanobeam electron diffraction ; 4D-STEM/PNBD Vědní obor RIV CB - Analytická chemie, separace Obor OECD Analytical chemistry Vědní obor RIV – spolupráce Ústav přístrojové techniky - Elektronika a optoelektronika, elektrotechnika CEP GA21-13541S GA ČR - Grantová agentura ČR TN01000008 GA TA ČR - Technologická agentura ČR Způsob publikování Open access Institucionální podpora UMCH-V - RVO:61389013 ; UPT-D - RVO:68081731 UT WOS 000643393700001 EID SCOPUS 85103859671 DOI 10.3390/nano11040962 Anotace We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. They can be used routinely to collect a high number of electron diffraction patterns from individual nanocrystals and/or locations (this is called four-dimensional scanning transmission electron microscopy (4D-STEM), as we obtain two-dimensional (2D) information for each pixel of the 2D scanning array). Nevertheless, the individual 4D-STEM diffractograms are difficult to analyze due to the random orientation of nanocrystalline material. In our method, all individual diffractograms (showing randomly oriented diffraction spots from a few nanocrystals) are combined into one composite diffraction pattern (showing diffraction rings typical of polycrystalline/powder materials). The final powder diffraction pattern can be analyzed by means of standard programs for TEM/SAED (Selected-Area Electron Diffraction). We called our new method 4D-STEM/PNBD (Powder NanoBeam Diffraction) and applied it to three different systems: Au nano-islands (well diffracting nanocrystals with size ~20 nm), small TbF3 nanocrystals (size < 5 nm), and large NaYF4 nanocrystals (size > 100 nm). In all three cases, the STEM/PNBD results were comparable to those obtained from TEM/SAED. Therefore, the 4D-STEM/PNBD method enables fast and simple analysis of nanocrystalline materials, which opens quite new possibilities in the field of SEM. Pracoviště Ústav makromolekulární chemie Kontakt Eva Čechová, cechova@imc.cas.cz ; Tel.: 296 809 358 Rok sběru 2022 Elektronická adresa https://www.mdpi.com/2079-4991/11/4/962
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