Study of charge carrier trapping by EPR and TSL methods in Zn.sub.x./sub.Mg.sub.1-x./sub.WO.sub.4./sub. single crystals

Krutyak, N., Spassky, D.A., Nagirnyi, V., Buryi, M., Tupitsyna, I., Dubovik, A. Study of charge carrier trapping by EPR and TSL methods in Zn_xMg_1-xWO₄ single crystals. Optical Materials. 2019, 96(Oct), 1-8), 109362. ISSN 0925-3467. E-ISSN 1873-1252. Dostupné z: doi: 10.1016/j.optmat.2019.109362.