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Ion beams provided by small accelerators for material synthesis and characterization
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SYSNO ASEP 0480644 Druh ASEP C - Konferenční příspěvek (mezinárodní konf.) Zařazení RIV D - Článek ve sborníku Název Ion beams provided by small accelerators for material synthesis and characterization Tvůrce(i) Macková, Anna (UJF-V) RID, ORCID, SAI
Havránek, Vladimír (UJF-V) RID, SAI, ORCIDCelkový počet autorů 2 Číslo článku 060003 Zdroj.dok. AIP Conference Proceedings, EXOTIC NUCLEI AND NUCLEAR/PARTICLE ASTROPHYSICS (VI). PHYSICS WITH SMALL ACCELERATORS: Proceedings of Carpathian Summer School of Physics 2016 (CSSP16), 1852. - Maryland : American Institute of Physics, 2017 - ISBN 978-0-7354-1526-3 Poč.str. 11 s. Forma vydání Tištěná - P Akce Carpathian Summer School of Physics 2016 Datum konání 26.06.2016 - 09.07.2016 Místo konání Sinaia Země RO - Rumunsko Typ akce WRD Jazyk dok. eng - angličtina Země vyd. US - Spojené státy americké Klíč. slova Ion beams ; Electrostatic accelerators ; Electronics ; Nanostructures ; Optics and optical physics Vědní obor RIV BG - Jaderná, atomová a mol. fyzika, urychlovače Obor OECD Nuclear physics CEP LM2015056 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy GA15-01602S GA ČR - Grantová agentura ČR Institucionální podpora UJF-V - RVO:61389005 UT WOS 000417364000021 EID SCOPUS 85023198139 DOI 10.10163/1.4984867 Anotace The compact, multipurpose electrostatic tandem accelerators are extensively used for production of ion beams with energies in the range from 400 keV to 24 MeV of almost all elements of the periodic system for the trace element analysis by means of nuclear analytical methods. The ion beams produced by small accelerators have a broad application, mainly for material characterization (Rutherford Back-Scattering spectrometry, Particle Induced X ray Emission analysis, Nuclear Reaction Analysis and Ion-Microprobe with 1 um lateral resolution among others) and for high-energy implantation. Material research belongs to traditionally progressive fields of technology. Due to the continuous miniaturization, the underlying structures are far beyond the analytical limits of the most conventional methods. Ion Beam Analysis (IBA) techniques provide this possibility as they use probes of similar or much smaller dimensions (particles, radiation). Ion beams can be used for the synthesis of new progressive functional nanomaterials for optics, electronics and other applications. Ion beams are extensively used in studies of the fundamental energetic ion interaction with matter as well as in the novel nanostructure synthesis using ion beam irradiation in various amorphous and crystalline materials in order to get structures with extraordinary functional properties. IBA methods serve for investigation of materials coming from material research, industry, micro- and nano-technology, electronics, optics and laser technology, chemical, biological and environmental investigation in general. Main research directions in laboratories employing small accelerators are also the preparation and characterization of micro- and nano-structured materials which are of interest for basic and oriented research in material science, and various studies of biological, geological, environmental and cultural heritage artefacts are provided too. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2018
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