Comparing proton and neutron induced SEU cross section in FPGA

Vaňát, Tomáš - Křížek, Filip - Ferencei, Jozef - Kubátová, H.
Comparing proton and neutron induced SEU cross section in FPGA.
Proceedings of hte 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2016). Košice: Institute of Electrical and Electronics Engineers Inc., 2016, s. 214-217. ISBN 978-1-5090-2467-4.
[19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2016). Košice (SK), 20.04.2016-22.04.2016]
http://hdl.handle.net/11104/0264844