Photoluminescence excitation of rare earth doped fluoride films by surface plasmon resonance in the Kretschman configuration

Bulíř, Jiří; Zikmund, Tomáš; Novotný, Michal; Lančok, Ján; Juha, Libor

Počet záznamů: 1

Photoluminescence excitation of rare earth doped fluoride films by surface plasmon resonance in the Kretschman configuration

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SYSNO ASEP	0455065
Druh ASEP	A - Abstrakt
Zařazení RIV	Není vybrán druh dokumentu
Název	Photoluminescence excitation of rare earth doped fluoride films by surface plasmon resonance in the Kretschman configuration
Tvůrce(i)	Bulíř, Jiří (FZU-D)_{RID, ORCID, SAI} Zikmund, Tomáš (FZU-D) Novotný, Michal (FZU-D)_{RID, ORCID, SAI} Lančok, Ján (FZU-D)_{RID, ORCID} Juha, Libor (FZU-D)_{RID, ORCID, SAI}
Zdroj.dok.	COLA 2015. International Conference on Laser Ablation 2015. Program handbook. - Canberra : Australian National University, 2015 / Rode A. - ISBN 978 0 64694 286 5 O 21
Poč.str.	1 s.
Forma vydání	Online - E
Akce	COLA 2015. International Conference on Laser Ablation 2015
Datum konání	31.08.2015-04.09.2015
Místo konání	Cairns
Země	AU - Austrálie
Typ akce	WRD
Jazyk dok.	eng - angličtina
Země vyd.	AU - Austrálie
Klíč. slova	photoluminescence ; rare earth ; fluoride ; surface plasmon resonance ; aluminium
Vědní obor RIV	BM - Fyzika pevných látek a magnetismus
CEP	GAP108/11/1312 GA ČR - Grantová agentura ČR
Institucionální podpora	FZU-D - RVO:68378271
Anotace	We report on excitation of the photoluminescence of rare earth doped fluoride by means of the surface plasmon resonance of Al layer. The advantage of this method is high efficiency of the excitation, which is applicable to ultra-thin films. The p-polarized UV diode laser light is coupled to surface plasmon resonance using a fused silica prism in a Kretschman configuration. The angular dependence of reflected intensity is measured using a theta-2theta goniometer. The surface plasmon at resonance condition induces the luminescence in the adjacent doped fluoride layer. The luminescence is collected using a fiber optics and detected by a spectrophotometer. For the experiment, we used pure LiF films and doped by Eu, Pr and Yb. The fluoride layer was deposited on Al-coated fused silica substrate by electron beam evaporation. For the experiment, we prepared several samples with thickness up-to 20 nm.
Pracoviště	Fyzikální ústav
Kontakt	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Rok sběru	2016

Počet záznamů: 1