X-ray laser-induced ablation of lead compounds

Hájková, V., Juha, L., Boháček, P., Burian, T., Chalupský, J., Vyšín, L., Gaudin, J., Heimann, P.A., Hau-Riege, S.P., Jurek, M., Klinger, D., Pelka, J., Sobierajski, R., Krzywinski, J., Messerschmidt, M., Moeller, S.P., Nagler, B., Rowen, M., Schlotter, W.F., Swiggers, M.L., Turner, J.J., Vinko, S.M., Whitcher, T., Wark, J., Matuchová, M., Bajt, S., Chapman, H., Fäustlin, R., Singer, A., Tiedtke, K., Toleikis, S., Vartaniants, I., Wabnitz, H., Dzelzainis, T., Riley, D., Andreasson, J., Hajdu, J., Iwan, B., Timneanu, N., Saksl, K. X-ray laser-induced ablation of lead compounds. In: JUHA, L., BAJT, S., LONDON, R.A., eds. Damage to VUV, EUV, and X-ray Optics III. Bellingham: SPIE, 2011, 807718/1-807718/7. Proceedings of SPIE, 8077. ISBN 9780819486677. ISSN 0277-786X. Dostupné z: http://dx.doi.org/10.1117/12.890134