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Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
- 1.Holovský, J., Ižák, T., Poruba, A., Vaněček, M., Hamers, E.A.G. Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates. In: ICANS23 - 23rd International Conference on Amorphous and Nanocrystaline Semiconductors. Book of Abstracts. Utrecht: Utrecht University, 2009, s. 332-332. ISBN N.
Počet záznamů: 1