Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates

HOLOVSKÝ, Jakub, IŽÁK, T., PORUBA, Aleš, VANĚČEK, Milan, HAMERS, E.A.G. Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates. In: ICANS23 - 23rd International Conference on Amorphous and Nanocrystaline Semiconductors. Book of Abstracts. Utrecht: Utrecht University, 2009, s. 332-332. ISBN N.