Jamelot, G. - Ros, D. - Carillon, A. - Rus, Bedřich - Mocek, Tomáš - Kozlová, Michaela - Präg R., Ansgar - Joyeux, D. - Phalippou, D. - Boussoukaya, M. - Kalmykow, M. - Ballester, F. - Jacques, E.
Nanometric deformations of thin Nb layers under a strong electric field using soft x-ray laser interferometry.
Journal of Applied Physics. Roč. 98, - (2005), 044308/1-044308/8. ISSN 0021-8979. E-ISSN 1089-7550
Grant CEP: GA MŠMT(CZ) LN00A100; GA AV ČR IAA1010014
Grant ostatní: EU(XE) HPRI-00108
Impakt faktor: 2.498, rok: 2005
http://hdl.handle.net/11104/0116070