Počet záznamů: 1
Trip steel specimen preparation for advanced sem and EBSD
- 1.
SYSNO ASEP 0536988 Druh ASEP C - Konferenční příspěvek (mezinárodní konf.) Zařazení RIV D - Článek ve sborníku Název Trip steel specimen preparation for advanced sem and EBSD Tvůrce(i) Ambrož, Ondřej (UPT-D) ORCID, RID, SAI
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Hegrová, J. (CZ)
Aoyama, T. (JP)Celkový počet autorů 4 Zdroj.dok. METAL 2020. 29th International Conference on Metallurgy and Materials. Proceedings. - Ostrava : TANGER, 2020 - ISSN 2694-9296 - ISBN 978-80-87294-97-0 Rozsah stran s. 518-522 Poč.str. 5 s. Forma vydání Tištěná - P Akce METAL 2020. International Conference on Metallurgy and Materials /29./ Datum konání 20.05.2020 - 22.05.2020 Místo konání Brno Země CZ - Česká republika Typ akce WRD Jazyk dok. eng - angličtina Země vyd. CZ - Česká republika Klíč. slova TRIP steel ; metallography ; SEM ; EBSD ; AFM Vědní obor RIV JA - Elektronika a optoelektronika, elektrotechnika Obor OECD Materials engineering CEP TN01000008 GA TA ČR - Technologická agentura ČR Institucionální podpora UPT-D - RVO:68081731 UT WOS 000794331100082 EID SCOPUS 85096802152 DOI 10.37904/metal.2020.3513 Anotace Modern scanning electron microscopy (SEM) allows observations of specimens with high surface sensitivity. The surface sensitivity is significantly affected by the accelerating voltages. With the development of the scanning electron microscopy, the requirements for the surface quality of samples increase. Metallographic methods originally intended for light microscopy become insufficient. The problem occurs especially with multiphase materials having a fine-grained structure. The investigated TRIP steel consists of a ferritic-bainitic matrix, retained austenite and martensite phases. The sizes of the smallest phases are nanometer units. The volume of residual austenite was determined by X-ray diffraction. The basic preparation of all tested samples involved conventional metallographic grinding and very fine mechanical polishing. One sample was analysed in this state. Other samples were subsequently chemically polished, electropolished and chemical-mechanically polished. The specimens were observed in the SEM using a SE and a BSE detector at low energies immediately after the preparation. An EBSD was performed in the same areas to characterize the retained austenite. Topographical imaging by special AFM, integrated into the SEM, demonstrated that the mechanical polishing results in surface deformation and residual austenite is transformed. All other methods have their specifics and for modern sensitive SEM instruments it is necessary to optimize individual procedures. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2021
Počet záznamů: 1