Počet záznamů: 1
Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy
- 1.Ledinský, M., Vetushka, A., Stuchlík, J., Fejfar, A., Kočka, J. Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy. In: CHAMPION, P.M., ZIEGLER, L.D., eds. XXII International Conference on Raman Spectroscopy. Melville: AIP, 2010, s. 1109-1110. AIP Conference Proceedings, 1267. ISBN 978-0-7354-0818-0.
Počet záznamů: 1