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Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy
- 1.LEDINSKÝ, Martin, VETUSHKA, Aliaksi, STUCHLÍK, Jiří, FEJFAR, Antonín, KOČKA, Jan. Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy. In: CHAMPION, P.M., ZIEGLER, L.D., eds. XXII International Conference on Raman Spectroscopy. Melville: AIP, 2010, s. 1109-1110. AIP Conference Proceedings, 1267. ISBN 978-0-7354-0818-0.
Počet záznamů: 1