Počet záznamů: 1
The high thermal conductivity of graphene prevents ZnO nanorod-graphene interface from degradation
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SYSNO ASEP 0572162 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název The high thermal conductivity of graphene prevents ZnO nanorod-graphene interface from degradation Tvůrce(i) Tiagulskyi, Stanislav (URE-Y)
Černohorský, Ondřej (URE-Y)
Bašinová, Nikola (URE-Y)
Yatskiv, Roman (URE-Y) RID, ORCID
Grym, Jan (URE-Y)Celkový počet autorů 5 Číslo článku 112286 Zdroj.dok. Materials Research Bulletin. - : Elsevier - ISSN 0025-5408
Roč. 164, AUG 2023 (2023)Poč.str. 5 s. Forma vydání Tištěná - P Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova nanostructures ; chemical synthesis ; electron microscopy ; electrical properties ; thermal conductivity Vědní obor RIV JA - Elektronika a optoelektronika, elektrotechnika Obor OECD Materials engineering CEP GA20-24366S GA ČR - Grantová agentura ČR Způsob publikování Omezený přístup Institucionální podpora URE-Y - RVO:67985882 UT WOS 000984372400001 EID SCOPUS 85152472539 DOI 10.1016/j.materresbull.2023.112286 Anotace The electrical and thermal properties of the junction between individual ZnO nanorods and conductive elec-trodes are investigated. It is demonstrated that a stable ohmic contact can be prepared between ZnO nanorods and graphene by eliminating contamination on the graphene surface by local Joule heating. Moreover, it is shown that, for conventional metal electrodes, such as copper, Joule self-heating forms hot spots and subse-quently causes thermal damage to the ZnO nanorod near the interface. This issue can be eliminated in graphene contacts because of their excellent thermal conductivity. The experimental results are validated by the numerical modeling of heat dissipation near the ZnO/graphene interface using COMSOL Multiphysics software. To char-acterize the interface between individual nanorods and graphene, a novel technique was developed using a nanomanipulator in the chamber of the scanning electron microscope. In contrast to conventional approaches, the method eliminates the use of extensive processing chemistry and allows observation of morphological changes in situ when performing electrical characterization. Pracoviště Ústav fotoniky a elektroniky Kontakt Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488 Rok sběru 2024 Elektronická adresa 10.1016/j.materresbull.2023.112286
Počet záznamů: 1