Počet záznamů: 1
Trajectory displacement in a multi beam scanning electron microscope
SYS 0549399 LBL 01000a^^22220027750^450 005 20240103230308.1 014 $a 85100426261 $2 SCOPUS 014 $a 33556712 $2 PUBMED 014 $a 000632279200007 $2 WOS 017 70
$a 10.1016/j.ultramic.2021.113223 $2 DOI 100 $a 20211209d m y slo 03 ba 101 0-
$a eng $d eng 102 $a NL 200 1-
$a Trajectory displacement in a multi beam scanning electron microscope 215 $a 8 s. $c P 463 -1
$1 001 cav_un_epca*0257685 $1 011 $a 0304-3991 $e 1879-2723 $1 200 1 $a Ultramicroscopy $v Roč. 223, April (2021) $1 210 $c Elsevier 608 $a Article 610 $a Trajectory displacement 610 $a Multi-beam electron microscope 610 $a Coulomb interactions 610 $a Slice method 610 $a Electron optics 700 -1
$3 cav_un_auth*0362486 $a Stopka $b Jan $p UPT-D $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $4 070 $z K $A 0000-0002-4404-721X $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0418617 $a Zuidema $b W. $y NL $4 070 $q Delft Univ Technol, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, Netherlands, 701 -1
$3 cav_un_auth*0093827 $a Kruit $b P. $y NL $4 070 $q Delft Univ Technol, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, Netherlands, 856 $u https://www.sciencedirect.com/science/article/pii/S030439912100019X $9 RIV
Počet záznamů: 1