Počet záznamů: 1
Ablation of single-crystalline cesium iodide by extreme ultraviolet capillary-discharge laser
- 1.
SYSNO ASEP 0538104 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Ablation of single-crystalline cesium iodide by extreme ultraviolet capillary-discharge laser Tvůrce(i) Wild, J. (CZ)
Pira, P. (CZ)
Burian, Tomáš (UFCH-W) ORCID, RID, SAI
Vyšín, L. (CZ)
Juha, L. (CZ)
Zelinger, Zdeněk (UFCH-W) RID, ORCID
Danis, S. (CZ)
Nehasil, V. (CZ)
Rafaj, Z. (CZ)
Nevrlý, V. (CZ)
Dostál, Michal (UFCH-W) RID, ORCID, SAI
Bitala, P. (CZ)
Kudrna, P. (CZ)
Tichý, M. (CZ)
Rocca, J.J. (US)Zdroj.dok. Nukleonika. - : Sciendo - ISSN 0029-5922
Roč. 65, č. 4 (2020), s. 205-210Poč.str. 6 s. Jazyk dok. eng - angličtina Země vyd. PL - Polsko Klíč. slova uv photocathodes ; csi ; Ablation ; CsI ; Desorption ; Laser ; pld ; xuv Vědní obor RIV CF - Fyzikální chemie a teoretická chemie Obor OECD Physical chemistry Způsob publikování Open access Institucionální podpora UFCH-W - RVO:61388955 UT WOS 000582490100001 EID SCOPUS 85096049178 DOI 10.2478/nuka-2020-0031 Anotace Extreme ultraviolet (XUV) capillary-discharge lasers (CDLs) are a suitable source for the efficient, clean ablation of ionic crystals, which are obviously difficult to ablate with conventional, long-wavelength lasers. In the present study, a single crystal of cesium iodide (CsI) was irradiated by multiple, focused 1.5-ns pulses of 46.9-nm radiation delivered from a compact XUV-CDL device operated at either 2-Hz or 3-Hz repetition rates. The ablation rates were determined from the depth of the craters produced by the accumulation of laser pulses. Langmuir probes were used to diagnose the plasma plume produced by the focused XUV-CDL beam. Both the electron density and electron temperature were sufficiently high to confirm that ablation was the key process in the observed CsI removal. Moreover, a CsI thin film on MgO substrate was prepared by XUV pulsed laser deposition. A fraction of the film was detected by X-ray photoelectron spectroscopy. Pracoviště Ústav fyzikální chemie J.Heyrovského Kontakt Michaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196 Rok sběru 2021 Elektronická adresa http://hdl.handle.net/11104/0315918
Počet záznamů: 1