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Laser-wakefield accelerators for high-resolution X-ray imaging of complex microstructures
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SYSNO ASEP 0520770 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Laser-wakefield accelerators for high-resolution X-ray imaging of complex microstructures Tvůrce(i) Hussein, A.E. (US)
Senabulya, N. (US)
Ma, Y. (US)
Streeter, M.J.V. (GB)
Kettle, B. (GB)
Dann, S. J. D. (GB)
Albert, F. (US)
Bourgeois, N. (GB)
Cipiccia, S. (GB)
Cole, J.M. (GB)
Finlay, O. (GB)
Gerstmayr, E. (GB)
Gonzalez, I.G. (SE)
Higginbotham, A. (GB)
Jaroszynski, D.A. (GB)
Falk, Kateřina (FZU-D) ORCID
Krushelnick, K. (US)
Lemos, N. (US)
Lopes, N. C. (GB)
Lumsdon, C. (GB)
Lundh, O. (SE)
Mangles, S.P.D. (GB)
Najmudin, Z. (GB)
Rajeev, P. P. (GB)
Schleputz, C.M. (CH)
Shahzad, M. (CH)
Šmíd, Michal (FZU-D) RID
Spesyvtsev, R. (GB)
Symes, D.R. (GB)
Vieux, G. (GB)
Willingale, L. (US)
Wood, J. C. (GB)
Shahani, A. J. (US)
Thomas, A.G.R. (US)Celkový počet autorů 34 Číslo článku 3249 Zdroj.dok. Scientific Reports. - : Nature Publishing Group - ISSN 2045-2322
Roč. 9, č. 1 (2019), s. 1-13Poč.str. 13 s. Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova laser-wakefield accelerators ; particle accelerators ; ultra-relativistic electron beam ; X-ray bright pulse ; imaging applications Vědní obor RIV BH - Optika, masery a lasery Obor OECD Optics (including laser optics and quantum optics) Způsob publikování Open access Institucionální podpora FZU-D - RVO:68378271 UT WOS 000459983900055 EID SCOPUS 85062258834 DOI 10.1038/s41598-019-39845-4 Anotace Laser-wakefield accelerators (LWFAs) are high acceleration-gradient plasma-based particle accelerators capable of producing ultra-relativistic electron beams. Within the strong focusing fields of the wakefield, accelerated electrons undergo betatron oscillations, emitting a bright pulse of X-rays with a micrometer-scale source size that may be used for imaging applications. Non-destructive X-ray phase contrast imaging and tomography of heterogeneous materials can provide insight into their processing, structure, and performance. To demonstrate the imaging capability of X-rays from an LWFA we have examined an irregular eutectic in the aluminum-silicon (Al-Si) system. We present comparisons between the sharpness and spatial resolution in phase contrast images of this eutectic alloy obtained via X-ray phase contrast imaging at the Swiss Light Source (SLS) synchrotron and X-ray projection microscopy via an LWFA source. Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2020 Elektronická adresa http://hdl.handle.net/11104/0305439
Počet záznamů: 1