Počet záznamů: 1
Graphene surface analysis and layer counting using scanning low energy electron microscopy
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SYSNO ASEP 0517435 Druh ASEP A - Abstrakt Zařazení RIV Záznam nebyl označen do RIV Zařazení RIV Není vybrán druh dokumentu Název Graphene surface analysis and layer counting using scanning low energy electron microscopy Tvůrce(i) Průcha, Lukáš (UPT-D) ORCID
Piňos, Jakub (UPT-D) RID, ORCID, SAI
Kizovský, Martin (UPT-D)
Mikmeková, Eliška (UPT-D) RIDCelkový počet autorů 4 Zdroj.dok. 5th Edition of the European Graphene Forum 2019. Book of Abstracts. - Lisbon : SETCOR, 2019 Poč.str. 1 s. Forma vydání Tištěná - P Akce Edition of the European Graphene Forum 2019 /5./ Datum konání 23.10.2019 - 25.10.2019 Místo konání Lisbon Země PT - Portugalsko Typ akce WRD Jazyk dok. eng - angličtina Země vyd. PT - Portugalsko Klíč. slova graphene analysis ; low energy electron microscopy ; scanning electron microscopy ; layer counting Vědní obor RIV JA - Elektronika a optoelektronika, elektrotechnika Obor OECD Nano-materials (production and properties) Institucionální podpora UPT-D - RVO:68081731 Anotace Scanning low energy electron microscopy (SLEEM) can be a very useful tool when it comes to the surface analysis and layer de-termination of graphene. This approach can be much more precise than conventional methods for the graphene layers determina-tion, such as Raman spectroscopy. In this work, we want to show, that through our SLEEM system MAMOTH, we can easily analyze graphene surface, count the graphene layers and even clean the surface out of air-adsorbed hydrocarbons with the same elec-tron beam. Thanks to this approach we are able to optically determine the morphology of layers of graphene flakes. In this study, we also want to show that our approach of the graphene layer analysis has more precise outcome than the conventional Raman analy-sis. The layer counting is carried out through the change in the reflectivity of the graphene flakes (layers) when low energy electrons (energy less than 50 eV) interact with the sur-face. As the electron energy goes higher, starting from 0 eV (thanks to the cathode lens), the reflectivity of graphene layers changes and creates for n-layered graphene n-1 reflectivity minima (Figure 1). For this work, all graphene samples were prepared in our prototype CVD furnace on copper foils. Also, graphene samples with different layers (ranging from one layer to FLG) were pre-pared through the change of the CVD system production parameters, so we can analyze and compare more different samples. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2020
Počet záznamů: 1