The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation

Nekvindová, P. - Švecová, B. - Staněk, S. - Vytykačová, S. - Macková, Anna - Malinský, Petr - Machovič, V. - Špirková, J.
The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation.
Ceramics - Silikáty. Roč. 59, č. 3 (2015), s. 187-193. ISSN 0862-5468. E-ISSN 1804-5847
Impakt faktor: 0.485, rok: 2015
http://hdl.handle.net/11104/0254757