The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation

Nekvindová, P., Švecová, B., Staněk, S., Vytykačová, S., Macková, A., Malinský, P., Machovič, V., Špirková, J. The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation. Ceramics - Silikáty. 2015, 59(3), 187-193. ISSN 0862-5468. E-ISSN 1804-5847.