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Silicon Nitride Microstructure Evaluation Using 3D EBSD Reconstruction
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SYSNO ASEP 0435044 Druh ASEP O - Ostatní výsledky Zařazení RIV O - Ostatní Název Silicon Nitride Microstructure Evaluation Using 3D EBSD Reconstruction Tvůrce(i) Chlup, Zdeněk (UFM-A) RID, ORCID
Lövy, V. (CZ)
Kuběna, Ivo (UFM-A) RID, ORCIDRok vydání 2014 Jazyk dok. eng - angličtina Země vyd. DE - Německo Klíč. slova Silicon nitride ; EBSD ; Microstructure Vědní obor RIV JH - Keramika, žáruvzdorné materiály a skla Institucionální podpora UFM-A - RVO:68081723 Anotace The microstructure of ceramic based on the silicon nitride is usually consisting of mixed uniaxial and elongated beta grains. The numerical modelling of material behaviour (i.e. elastic constant calculation, stress concentration, crack initiation and propagation, damage evolution etc.) on the microstructural (grain) level is possible only when detailed and realistic description of the microstructure is available. The classical materialography provides good information about grain structure for materials having mostly uniaxial grains where statistical approaches are available. The two dimensional EBSD mapping provides additionally grains orientation and texture information. The complex silicon nitride microstructure can be fully described only by the realistic 3D model. The presented work is concentrated on the preparation of such 3D EBSD model of silicon nitride structural ceramic. There arise a number of obstacles which have to be overcome during individual reconstruction steps. This counts the sample preparation, optimisation of milling process, adjustment of the EBSD data collection and evaluation and finally the data post processing. The latest results will be presented and comparison with the grain size distribution and grain aspect ratios development determined by the classical approaches will be provided. Pracoviště Ústav fyziky materiálu Kontakt Yvonna Šrámková, sramkova@ipm.cz, Tel.: 532 290 485 Rok sběru 2015
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