Počet záznamů: 1
Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy
- 1.Ledinský, Martin - Fejfar, Antonín - Vetushka, Aliaksi - Stuchlík, Jiří - Kočka, Jan
Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy.
Journal of Non-Crystalline Solids. Roč. 358, č. 17 (2012), s. 2082-2085. ISSN 0022-3093. E-ISSN 1873-4812.
[International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS) /24./. Nara, 21.08.2011-26.08.2011]
Impakt faktor: 1.597, rok: 2012
http://www.sciencedirect.com/science/article/pii/S0022309312000178
http://hdl.handle.net/11104/0216097
Počet záznamů: 1