Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy

LEDINSKÝ, Martin, FEJFAR, Antonín, VETUSHKA, Aliaksi, STUCHLÍK, Jiří, KOČKA, Jan. Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy. Journal of Non-Crystalline Solids. 2012, 358(17), 2082-2085. ISSN 0022-3093. E-ISSN 1873-4812. Dostupné z: doi: 10.1016/j.jnoncrysol.2012.01.015.