Počet záznamů: 1
The morphology of Co+ implanted nano-structures in PEEK, PET and PI
- 1.
SYSNO ASEP 0382674 Zařazení RIV Záznam nebyl označen do RIV Název The morphology of Co+ implanted nano-structures in PEEK, PET and PI Tvůrce(i) Macková, Anna (UJF-V) RID, ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Mikšová, Romana (UJF-V) RID, ORCID, SAI
Khaibullin, R. I. (RU)
Švorčík, V. (CZ)
Slepička, P. (CZ)
Slouf, M.
Kormunda, M. (CZ)Celkový počet autorů 8 Zdroj.dok. Abstracts Book. -, 2012 Poč.str. 1 s. Akce The 6th International Meeting on Developments in Materials, Processes and Applications of Emerging Technologies Datum konání 02.07.2012-04.07.2012 Místo konání Alvor Země PT - Portugalsko Jazyk dok. eng - angličtina Země vyd. PT - Portugalsko Klíč. slova implantation ; polymers ; nano-particles Vědní obor RIV BG - Jaderná, atomová a mol. fyzika, urychlovače Vědní obor RIV – spolupráce Elektronika a optoelektronika, elektrotechnika CEP 106/09/0125 GA AV ČR - Akademie věd Institucionální podpora UJF-V - RVO:61389005 Anotace Ion beam technique is a widely used, flexible and powerful tool for different materials surface engineering including polymers. High-fluence implantation of metal ions is possible tool for controlling the size and density of the metal nano-particles. The morphology of the implanted layers depends strongly on the ion fluence and the physico-chemical properties of the implanted substrates. Specimens of polyimide (PI), polyetheretherketone (PEEK), and polyethyleneterephtalate (PET) were implanted by 80 keV Co+ ions at room temperature at fluence 1.0x1016 cm–2 and annealed at temperatures below and close to Tg up to 300°C. Implanted depth profiles of as-implanted and as-annealed samples determined by RBS were compared with SRIM 2008 and TRIDYN theoretical predictions. The profiles in the as implanted samples agree reasonably with those simulated using TRIDYN code. The implanted Co atoms tend to aggregate into nano-particles, the size and distribution of which was determined from TEM micrographs and is influenced by the annealing temperature. XPS analysis was used to study chemical groups in the implanted layer of polymers. The surface morphology and roughness of ion treated polymers was determined by the AFM study. RBS and XPS results show changes of implanted depth profiles and chemical composition according to the used ion fluence and annealing temperature. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2013
Počet záznamů: 1