Počet záznamů: 1
New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes
- 1.Neděla, V., Konvalina, I., Lencová, B., Zlámal, J., Jirák, J. New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes. In: Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8.
Počet záznamů: 1