New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes

NEDĚLA, V., KONVALINA, I., LENCOVÁ, B., ZLÁMAL, J., JIRÁK, J. New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes. In: Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8.