Počet záznamů: 1
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
- 1.Holovský, Jakub - Ižák, T. - Poruba, Aleš - Vaněček, Milan - Hamers, E.A.G.
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates.
ICANS23 - 23rd International Conference on Amorphous and Nanocrystaline Semiconductors. Book of Abstracts. Utrecht: Utrecht University, 2009. s. 332-332. ISBN N.
[International Conference on Amorphous and Nanocrystaline Semiconductors /23./ (ICANS23). 23.08.2009-28.08.2009, Utrecht]
http://hdl.handle.net/11104/0182026
Počet záznamů: 1