RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI

Macková, A., Bočan, J., Khaibullin, R. I., Švorčík, V., Slepička, P., Siegel, J., Valeev, V. F. RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI. In: 16th International Conference on Ion Beam Modification of Materials Book of Abstracts. Dresden: Institute of Ion Beam Physics and Materials Research, Forschungzentrum Dresden-Rossendorf, 2008, s. 317-317.