Počet záznamů: 1
High-pass energy-filtered photoemission electron microscopy imaging of dopants in silicon
- 1.HOVORKA, M., FRANK, L., VALDAITSEV, D., NEPIJKO, S., ELMERS, H., SCHÖNHENSE, G. High-pass energy-filtered photoemission electron microscopy imaging of dopants in silicon. Journal of Microscopy. 2008, 230(1), 42-47. ISSN 0022-2720. E-ISSN 1365-2818.
Počet záznamů: 1