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Characterization of polystyrene and doped polymethylmethacrylate thin layers
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SYSNO ASEP 0307936 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Ostatní články Název Characterization of polystyrene and doped polymethylmethacrylate thin layers Překlad názvu Charakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu Tvůrce(i) Podgrabinski, T. (CZ)
Hrabovská, E. (CZ)
Švorčík, V. (CZ)
Hnatowicz, Vladimír (UJF-V) RIDZdroj.dok. Journal of Materials Science-Materials in Electronics. - : Springer - ISSN 0957-4522
Roč. 16, 11-12 (2005), s. 761-765Poč.str. 5 s. Jazyk dok. eng - angličtina Země vyd. NL - Nizozemsko Klíč. slova dielectrical properties Vědní obor RIV BG - Jaderná, atomová a mol. fyzika, urychlovače CEP GA106/03/0514 GA ČR - Grantová agentura ČR CEZ AV0Z10480505 - UJF-V (2005-2011) Anotace About 1 mu m thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T-g) of doped PMMA films was determined by DSC technique and relative permittivity (epsilon) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using a standard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T-g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivity epsilon of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2008
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