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Examination of electronic structures and materials in scanning low energy electron microscope (SLEEM)
- 1.MÜLLEROVÁ, Ilona, FRANK, Luděk. Examination of electronic structures and materials in scanning low energy electron microscope (SLEEM). In: ŠANDERA, P., ed. Abstract Booklet of the International Conference NANO'03. Brno: FS VUT Brno, 2003, s. 26. ISBN 80-214-2486-9.
Počet záznamů: 1