Efect Recognition in Semiconductor Heterostructures on Bevelled Surface

Srnánek, R., Škriniarová, J., Kováč, J., Frank, L., Novotný, I., Hotový, I., Gottschalch, V. Efect Recognition in Semiconductor Heterostructures on Bevelled Surface. In: Abstracts of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors DRIP VII. Berlin: Institute of Crystal Growth, 1997, s. 10.8.