Počet záznamů: 1
Ellipsometric investigations of the refractive index depth profile in PZT thin films
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SYSNO 0133592 Title Ellipsometric investigations of the refractive index depth profile in PZT thin films Author(s) Deineka, Alexander (FZU-D)
Jastrabík, Lubomír (FZU-D) RID, ORCID
Suchaneck, G. (DE)
Gerlach, G. (DE)Source Title Physica Status Solidi A : Applied Research. Roč. 188, č. 4 (2001), s. 1549-1552 Document Type Článek v odborném periodiku Grant LN00A015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA202/00/1425 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z1010914 - FZU-D Language eng Country DE Keywords PZT films * optical investigations Permanent Link http://hdl.handle.net/11104/0031555
Počet záznamů: 1