Characterization of Phase Transitions in PZT Ferroelectric films with spectral Ellipsometry

0134091 - FZU-D 20020380 RIV CZ eng J - Článek v odborném periodiku
Deineka, Alexander - Suchaneck, G. - Jastrabík, Lubomír - Gerlach, G.
Characterization of Phase Transitions in PZT Ferroelectric films with spectral Ellipsometry.
Jemná mechanika a optika. 11-12, - (2002), s. 377-380. ISSN 0447-6441
Grant CEP: GA MŠk LN00A015; GA ČR GA202/00/1425
Výzkumný záměr: CEZ:AV0Z1010921
Klíčová slova: ferroelectric film * phase transition * film profile
Kód oboru RIV: BH - Optika, masery a lasery

In this work, high temperature ellipsometric investigations of the PbZr_0.235Ti_0.765O₃(PTZ) films prepared with different techniques are summarized with regard to recently obtained phase transitons at elevated temperatures belw the Curie point. The temperature dependences of the refractive index at fixed wavelenghts, refractive index profiles, and temperature dependence of optical gapare described.
Trvalý link: http://hdl.handle.net/11104/0032028