0585608 - FZÚ DATA Vědecká data      2024
Correa, Cinthia Antunes - More Chevalier, Joris - Hruška, Petr - Poupon, Morgane - Novotný, Michal - Minárik, P. - Hubík, Pavel - Lukáč, František - Fekete, Ladislav - Prokop, Dejan - Hanuš, J. - Valenta, J. - Fitl, Přemysl - Lančok, Ján

Dataset for Microstructure and physical properties of black aluminum antireflective films.

Popis: The files are related to the manuscript „Microstructure and physical properties of Black-Aluminum antireflective films“ and are organized in the sequence of appearance in the manuscript. The nomenclature of the files follows the sequence:
Figure, number of the figure appearing in the manuscript (from 1 – 7), type of data (XRD, AFM, TEM, EDX, PALS, Reflectance, Carrier concentration, Electrical mobility, or resistivity), thin film sample related to (R-Al or B-Al), film thickness (60, 180, 250, 320, or 410 nm).
TEM image files are raw, as collected, while the ones in the manuscript were cropped to show the differences between the films.

Klíčová slova: powder x-ray diffraction * atomic force microscopy * transmission electron microscopy * energy dispersive x-ray analysis * positron annihilation spectroscopy * reflectivity, resistivity * hall measurements
Grant CEP: GA ČR GA23-05002S; GA MŠMT(CZ) EH22_008/0004596; GA MŠMT LM2023051
Institucionální podpora: RVO:68378271Institucionální podpora: RVO:61389021
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.); Materials engineering (UFP-V)
DOI: https://doi.org/10.57680/asep.0585608
Handle: https://hdl.handle.net/11104/0353281
Vkladatel: admin
Datum publikování: 2.5.2024
 
Publikace ASEP:
Microstructure and physical properties of black-aluminum antireflective films
 
Licence: CC BY 4.0 - Uveďte původ Mezinárodní licence