Heat-induced variation of second-harmonic generation in silicon oxynitride thin films

0584197 - ÚFP 2024 RIV US eng A - Abstrakt
Lukeš, Jakub - Žídek, Karel
Heat-induced variation of second-harmonic generation in silicon oxynitride thin films.
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference. New Jersey: Institute of Electrical and Electronics Engineers Inc., 2023. (2023), č. článku 192392. ISBN 9798350345995.
[2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023. 26.06.2023-30.06.2023, Mnichov]
Institucionální podpora: RVO:61389021
Klíčová slova: nanosecond * FLIM * laser
Obor OECD: Optics (including laser optics and quantum optics)
https://ieeexplore.ieee.org/document/10232676

Fluorescence lifetime imaging (FLIM) is an indispensable tool for many fields, including material research or biophysics. Therefore, the search for a new robust and low-cost method for FLIM is of high interest. We present a novel RAndom Temporal Signals (RATS) method for FLIM. The RATS technique reaches a higher signal-to-noise ratio (SNR) compared to conventional time-resolved methods due to continuous random excitation. Moreover, it eliminates the need to choose the correct repetition pulse rate and avoids additional signal timing.
Trvalý link: https://hdl.handle.net/11104/0352422