Damage threshold of LiF crystal irradiated by femtosecond hard XFEL pulse sequence

0573902 - FZÚ 2024 RIV US eng J - Článek v odborném periodiku
Makarov, S. - Grigoryev, S. - Inogamov, N. - Vozda, Vojtěch - Hájková, Věra - Burian, Tomáš - Chalupský, Jaromír - Juha, Libor … celkem 28 autorů
Damage threshold of LiF crystal irradiated by femtosecond hard XFEL pulse sequence.
Optics Express. Roč. 31, č. 16 (2023), č. článku 26395. ISSN 1094-4087
Grant CEP: GA MŠMT(CZ) EF18_053/0016627; GA ČR(CZ) GA20-08452S
Grant ostatní: OP VVV - Mobility FZU 2(XE) CZ.02.2.69/0.0/0.0/18_053/0016627
Institucionální podpora: RVO:68378271
Klíčová slova: LiF crystal irradiation * damage threshold * femtosecond hard XFEL pulse sequence
Obor OECD: Optics (including laser optics and quantum optics)
Impakt faktor: 3.8, rok: 2022
Způsob publikování: Open access

Here we demonstrate the results of investigating the damage threshold of a LiF crystal after irradiating it with a sequence of coherent femtosecond pulses using the European X-ray Free Electron Laser (EuXFEL). The laser fluxes on the crystal surface varied in the range ∼0.015–13 kJ/cm2 per pulse when irradiated with a sequence of 1-100 pulses (tpulse ∼20 fs, Eph = 9keV). Analysis of the surface of the irradiated crystal using different reading systems allowed the damage areas and the topology of the craters formed to be accurately determined. It was found that the ablation threshold decreases with increasing number of X-ray pulses, while the depth of the formed craters increases non-linearly and reaches several hundred nanometers. The obtained results have been compared with data already available in the literature for nano- and picosecond pulses from lasers in the soft X-ray/VUV and optical ranges.
Trvalý link: https://hdl.handle.net/11104/0344294