New insight into gain suppression and single event Burnout effects in LGAD

0573078 - FZÚ 2024 RIV US eng J - Článek v odborném periodiku
Laštovička-Medin, G. - Kramberger, G. - Rebarz, M. - Manojlovic, M. - Andreasson, J. - Laštovička, T. - Kroll, Jiří
New insight into gain suppression and single event Burnout effects in LGAD.
Journal of Instrumentation. Roč. 18, č. 2 (2023), č. článku C02059. ISSN 1748-0221. E-ISSN 1748-0221
Grant CEP: GA MŠMT LM2023040
Institucionální podpora: RVO:68378271
Klíčová slova: solid state detectors * timing detectors * charge transport and multiplication in solid media * radiation damage to detector materials (solid state)
Obor OECD: Particles and field physics
Impakt faktor: 1.3, rok: 2022
Způsob publikování: Omezený přístup
https://doi.org/10.1088/1748-0221/18/02/C02059

Low Gain Avalanche Detectors (LGADs) will be employed in the CMS MTD and ATLAS HGTD upgrades to mitigate the high levels of pile-up events expected in the High Luminosity phase of the LHC. Over the last several years, much attention has been focused on designing radiation-tolerant gain implants to ensure that these sensors survive the expected fluence (>101515 neqeq​/cm22). This work reports several effects observed during our previous studies on two relevant phenomena Single Event Burnout (SEB) and carrier density-induced Gain Suppression (GS). Influence of irradiation level, pad configuration and gain layer depth on SEB are discussed. In this paper, we also extend GS study with a new insight into the spatio-temporal dynamics of charge transport in LGAD, probed with a focused ion beam.
Trvalý link: https://hdl.handle.net/11104/0350571