LIDT testing as a tool for optimization of processing window for D263 glass sheet TGV treatment

0569382 - FZÚ 2023 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Vanda, Jan - Mydlář, Martin - Pilná, Kateřina - Turčičová, Hana - Pobořil, Radek - Brajer, Jan - Mocek, Tomáš - Stoklasa, B. - Venos, Š.
LIDT testing as a tool for optimization of processing window for D263 glass sheet TGV treatment.
Laser-Induced Damage in Optical Materials 2022. Bellingham: SPIE, 2022 - (Carr, C.; Ristau, D.; Menoni, C.), č. článku 1230003. ISBN 978-1-5106-5662-8. ISSN 0277-786X.
[SPIE Laser Damage 2022. New York (US), 18.09.2022-22.09.2022]
Grant CEP: GA MŠMT LO1602; GA TA ČR TM01000021; GA MŠMT LM2015086; GA MŠMT EF15_006/0000674
GRANT EU: European Commission(XE) 739573 - HiLASE CoE
Grant ostatní: OP VVV - HiLASE-CoE(XE) CZ.02.1.01/0.0/0.0/15_006/0000674
Institucionální podpora: RVO:68378271
Klíčová slova: TGV * LIDT * DPSSL * laser * ultra-short pulses
Obor OECD: Optics (including laser optics and quantum optics)
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12300/2642866/LIDT-testing-as-a-tool-for-optimization-of-processing-window/10.1117/12.2642866.short?SSO=1

Laser-Induced Deep Etching (LIDE) is considered as the one of the most promising techniques for production of so-called TGVs (Through Glass Vias). In the production process, thin glass sheet is treated with ultra-short lasers pulses to induce surface and volume modification, allowing efficient wet etching and formation of through hole. Precise knowledge of damage threshold of such glass is essential when optimizing the whole process and scaling up the production via laser beam parallelization. In following paper, we present recent results on LIDT measurement of D263 glass sheets at wavelengths 1030 nm and 515 nm, effective utilization of such knowledge for setting up multi-Bessel beam processing optics, and we demonstrate resulting substrates with TGVs.
Trvalý link: https://hdl.handle.net/11104/0340814