Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar.sup.+./sup. ion beam

0562898 - FZÚ 2023 RIV GB eng J - Článek v odborném periodiku
Vacík, J. - Cannavó, A. - Bakardjieva, S. - Kupčík, Jaroslav - Lavrentiev, V. - Ceccio, G. - Horák, P. - Němeček, J. - Verna, A. - Parmeggiani, M. - Calcagno, L. - Klie, R. - Duchoň, Jan
Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar⁺ ion beam.
Radiation Effects and Defects in Solids. Roč. 177, 1-2 (2022), s. 137-160. ISSN 1042-0150. E-ISSN 1029-4953
Grant CEP: GA MŠMT LM2018110
Institucionální podpora: RVO:68378271
Klíčová slova: ion beam synthesis * Hf-In-C nanocomposite * Hf₂InC MAX phase * HfC_0.95 phase * radiation tolerance
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 1, rok: 2022
Způsob publikování: Omezený přístup
https://doi.org/10.1080/10420150.2022.2049788

After fabrication the Hf-In-C nanostructures a part of the pristine (as deposited) samplex was irradiated by 200 KeV Ar.+. ions at high fluences 10.15. and 10.17. cm.-2.. Both samples (as prepared and irradiated)were analyzed by IBA nuclear analytical methods, as well as by AFM and TEM microscopic techniques, and by XPS and profilometry to understand the microstructural evolution.
Trvalý link: https://hdl.handle.net/11104/0335067