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Photoionization and transient Wannier-Stark ladder in silicon: First-principles simulations versus Keldysh theory
- 1.0561201 - FZÚ 2023 RIV US eng J - Článek v odborném periodiku
Derrien, Thibault - Tancogne-Dejean, N. - Zhukov, Vladimir - Appel, H. - Rubio, A. - Bulgakova, Nadezhda M.
Photoionization and transient Wannier-Stark ladder in silicon: First-principles simulations versus Keldysh theory.
Physical Review B. Roč. 104, č. 24 (2021), č. článku L241201. ISSN 2469-9950. E-ISSN 2469-9969
Grant CEP: GA MŠMT EF15_003/0000445; GA MŠMT EF15_006/0000674
GRANT EU: European Commission(XE) 823897 - ATLANTIC
Grant ostatní: OP VVV - BIATRI(XE) CZ.02.1.01/0.0/0.0/15_003/0000445; OP VVV - HiLASE-CoE(XE) CZ.02.1.01/0.0/0.0/15_006/0000674
Výzkumná infrastruktura: e-INFRA CZ - 90140
Institucionální podpora: RVO:68378271
Klíčová slova: nonlinear photoionization * semiconductors * Keldysh theory * TDDFT * silicon crystal * ultrashort laser
Obor OECD: Optics (including laser optics and quantum optics)
Impakt faktor: 3.908, rok: 2021
Způsob publikování: Open access
Nonlinear photoionization of dielectrics and semiconductors is widely treated in the framework of the Keldysh theory whose validity is limited to photon energies that are small compared to the band gap and relatively low laser intensities. The time-dependent density functional theory (TDDFT) simulations, which are free of these limitations, enable one to gain insight into nonequilibrium dynamics of the electronic structure. Here we apply TDDFT to investigate the photoionization of silicon crystal by ultrashort laser pulses in a wide range of laser wavelengths and intensities and compare the results with predictions of the Keldysh theory. Photoionization rates derived from the simulations considerably exceed the data obtained with the Keldysh theory within the validity range of the latter. Possible reasons for the discrepancy are discussed and we provide fundamental data on the photoionization rates beyond the limits of the Keldysh theory.
Trvalý link: https://hdl.handle.net/11104/0333877
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