General overview of GaN devices and transport properties of AlGaN/GaN HEMT structures - impact of dislocation density and improved design

0561007 - FZÚ 2023 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Hulicius, Eduard - Hájek, František - Hospodková, Alice - Hubík, Pavel - Gedeonová, Zuzana - Hubáček, Tomáš - Pangrác, Jiří - Kuldová, Karla
General overview of GaN devices and transport properties of AlGaN/GaN HEMT structures - impact of dislocation density and improved design.
NANOCON 2021 - Conference proceedings. Ostrava: Tanger Ltd., 2021, s. 17-22. ISBN 978-80-88365-00-6. ISSN 2694-930X.
[International Conference on Nanomaterials - Research & Application /13./ NANOCON. Brno (CZ), 20.10.2021-22.10.2021]
Grant CEP: GA MŠMT LM2018110; GA MŠMT(CZ) LTAIN19163; GA MŠMT(CZ) EF16_019/0000760
Grant ostatní: OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
Institucionální podpora: RVO:68378271
Klíčová slova: GaN devices * HEMT * MOVPE epitaxy * dislocation
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://www.confer.cz/nanocon/2021/4309-general-over-view-of-gan-devices-and-transport-properties-of-algan-gan-hemt-structures-impact-of-dislocation-density-and-improved-design

GaN-based nanostructures are used for many present semiconductor devices. The main topics are structures for blue LEDs and LDs, but there are also other interesting and important GaN devices namely for power electronics, scintillators and detectors as well as High Electron Mobility Transistors (HEMT). Reduction of dislocation density considerably increases electron mobility in 2DEG. All presented results support our expectation that a suitably designed AlGaN back barrier can help to prevent this phenomenon.
Trvalý link: https://hdl.handle.net/11104/0333759