Precision of silicon oxynitride refractive-index profile retrieval using optical characterization

0560455 - ÚFP 2023 RIV PL eng J - Článek v odborném periodiku
Kanclíř, Vít - Václavík, Jan - Žídek, Karel
Precision of silicon oxynitride refractive-index profile retrieval using optical characterization.
Acta Physica Polonica A. Roč. 143, č. 3 (2021), s. 215-221. ISSN 0587-4246. E-ISSN 1898-794X
Grant CEP: GA MŠMT(CZ) EF16_026/0008390
Grant ostatní: GA AV ČR(CZ) StrategieAV21/17
Program: StrategieAV
Institucionální podpora: RVO:61389021
Klíčová slova: Dual ion beam sputtering * Gradient refractive-index layers * Precision of optical characterization * Silicon oxynitride
Obor OECD: Optics (including laser optics and quantum optics)
Impakt faktor: 0.725, rok: 2021
Způsob publikování: Open access
http://przyrbwn.icm.edu.pl/APP/PDF/140/app140z3p04.pdf

Layers with a gradient refractive-index profile are an attractive alternative to conventional homogeneous stack coatings. However, the optical characterization and monitoring of the graded refractive-index profile is a complex issue that has usually been solved with a simplified model of mixed materials. Although such an approach provides a solution to the problem, the precision, which can be expected from optical characterization of the refractive-index gradient, remains unclear. In this work, we study optical characterization of SiOxNy layers deposited via reactive dual ion beam sputtering. To characterize the deposited layers, we use several methods including reflectance and transmittance spectra at a broad range of incident angles together with spectral ellipsometry. All the data were simultaneously fitted with a general profile of the refractive index. The expected profile used in our fit was based on the characterization of SiOxNy layers with a varying stoichiometry. By altering the profile, we discussed the sensitivity of alternation on the fit quality and we studied the ambiguity of the merit-function minimization. We demonstrate that while the scanning of particular parameters of the profile can be seemingly very precise, we obtain a very good agreement between the experimental data and the model for a broad range of gradient shapes. Our calculation shows that the refractive-index value on the major part of the profile can differ as much as 0.02 from the mean value.
Trvalý link: https://hdl.handle.net/11104/0333383