Polarization in pseudocubic epitaxial relaxed PMN-PT thin films

0555077 - FZÚ 2023 RIV US eng J - Článek v odborném periodiku
Trstenjak, U. - Daneu, N. - Rafalovskyi, Iegor - Belhadi, J. - Vengust, D. - Hlinka, Jiří - Spreitzer, M.
Polarization in pseudocubic epitaxial relaxed PMN-PT thin films.
Applied Physics Letters. Roč. 120, č. 4 (2022), č. článku 042901. ISSN 0003-6951. E-ISSN 1077-3118
Grant CEP: GA MŠMT(CZ) EF16_019/0000760
Grant ostatní: OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
Institucionální podpora: RVO:68378271
Klíčová slova: thin films * ferroelectries * Raman scattering * relaxors * PMN-PT
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 4, rok: 2022
Způsob publikování: Open access

In this work, the structure of epitaxial relaxed pulsed-laser-deposited Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-xPT, x = 25, 33, and 40) thin films on LaNiO3/SrTiO3 substrates is analyzed using a variety of diffraction and spectroscopic techniques. While based on the data obtained from high-resolution x-ray diffraction and scanning transmission electron microscopy analysis, the average structure of the PMN-xPT films is metrically cubic, micro-Raman polarimetry measurements indicate the tetragonal-like ferroelectric phase with marked preference for the polarization perpendicular to the film for all three compositions.
Trvalý link: http://hdl.handle.net/11104/0330642