Localized Spectroelectrochemical Identification of Basal Plane and Defect-Related Charge-Transfer Processes in Graphene

0551620 - ÚFCH JH 2023 RIV US eng J - Článek v odborném periodiku
Jindra, Martin - Velický, Matěj - Bouša, Milan - Abbas, Ghulam - Kalbáč, Martin - Frank, Otakar
Localized Spectroelectrochemical Identification of Basal Plane and Defect-Related Charge-Transfer Processes in Graphene.
Journal of Physical Chemistry Letters. Roč. 13, č. 2 (2022), s. 642-648. ISSN 1948-7185
Grant CEP: GA ČR(CZ) GX20-08633X; GA MŠMT EF16_026/0008382
Grant ostatní: Ministerstvo školství, mládeže a tělovýchovy - GA MŠk(CZ) CZ.02.1.01/0.0/0.0/16_026/0008382
Institucionální podpora: RVO:61388955
Klíčová slova: spectroelectrochemistry * graphene * two-dimensional materials
Obor OECD: Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)
Impakt faktor: 5.7, rok: 2022
Způsob publikování: Open access

It is well-known that structural defects play a decisive role in electrochemical behavior of atomically thin materials, where all the defects are directly accessible by the electrolyte. However, the vast majority of experimental techniques do not allow disentanglement of the processes at the edges/defects from those at the intact basal plane. Therefore, to address this issue, we introduce a localized spectroelectrochemical method featuring a microdroplet electrochemical cell with simultaneous Raman spectroscopy monitoring. The electrochemical and spectral responses of the basal planes of monolayer graphene samples with varying levels of disorder were compared. Two contributions, stemming from the intact and defective areas on the surface, respectively, were discovered both in the Raman G band shifts and cyclic voltammetry using the hexaammineruthenium complex. Consequently, two independent electron transfer processes of slower and faster rates coexist in one sample, but they are restricted to the defect-free and defect-rich areas, respectively.
Trvalý link: http://hdl.handle.net/11104/0326866